Published August 15, 2006
| Version v1
Journal article
Morphological and electronic properties of the thin film phase of pentacene investigated by AFM and STM/STS
Creators
- 1. Dipartimento di Fisica, Universita degli studi dell'Aquila, Via Vetoio, 67010 Coppito, L'Aquila (Italy)
Description
We investigated the morphological, structural and electronic properties of Pentacene thin films grown by vacuum thermal evaporation on different inert substrates at room temperature. The results of our AFM and STM analysis give an interplanar spacing of 1.54 nm corresponding to the (0 0 1) distance of the so-called 'thin film phase'. The STS measurements show an HOMO-LUMO gap of 2.2 eV
Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2005.08.103;
- PII
- S0169-4332(05)01256-0;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 252
- Journal Issue
- 20
- Journal Page Range
- p. 7469-7472
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38104225
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; EV RANGE 01-10; EVAPORATION; ORGANIC SEMICONDUCTORS; PENTACENE; SCANNING TUNNELING MICROSCOPY; TEMPERATURE RANGE 0273-0400 K; THIN FILMS
- Descriptors DEC
- AROMATICS; CONDENSED AROMATICS; ENERGY RANGE; EV RANGE; FILMS; HYDROCARBONS; MATERIALS; MICROSCOPY; ORGANIC COMPOUNDS; PHASE TRANSFORMATIONS; SEMICONDUCTOR MATERIALS; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.