Published April 1997
| Version v1
Journal article
Simulating the transient response of a laser diode to ionizing pulses
Description
When subject to ionizing radiation, double-heterojunction diodes undergo changes that are difficult to determine from experimental results alone. This article discusses 2D simulation tools for investigating these phenomena. (authors)
Additional details
Additional titles
- Original title (French)
- Simulation de la reponse transitoire d'une diode laser a une impulsion ionisante
Publishing Information
- Journal Title
- REE. Revue de l'Electricite et de l'Electronique
- Journal Issue
- no.4
- Journal Page Range
- p. 71-74
- ISSN
- 1265-6534
- CODEN
- REELF3
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 29063464
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- COMPUTERIZED SIMULATION; CURRENT DENSITY; ELECTRON-HOLE DROPLETS; FABRY-PEROT INTERFEROMETER; HETEROJUNCTIONS; PHOTOCURRENTS; PHOTODIODES; PHYSICAL RADIATION EFFECTS; SEMICONDUCTOR DIODES; TRANSIENTS
- Descriptors DEC
- CURRENTS; ELECTRIC CURRENTS; INTERFEROMETERS; MEASURING INSTRUMENTS; RADIATION EFFECTS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMICONDUCTOR JUNCTIONS; SIMULATION
Optional Information
- Notes
- 9 refs.