Published 1989
| Version v1
Journal article
Fluorine-silicon reactions and the etching of crystalline silicon
- 1. IBM Research Div., Yorktown Heights, NY (USA)
Description
The interaction between fluorine atoms and crystalline silicon, which is essential for etching processes in semiconductor device fabrication, is investigated with state-of-the-art theoretical techniques. A comprehensive picture of F reactions with the Si surface, the bulk, and the near-surface region is obtained, in terms of which the etching process is elucidated. (author) 7 refs., 1 fig
Additional details
Publishing Information
- Journal Title
- Materials Science Forum
- Journal Volume
- 38-41
- Series
- Mater. Sci. Forum.
- Journal Page Range
- 335-339
- ISSN
- 0255-5476
- CODEN
- MSFOE
Conference
- Title
- 15. International conference on defects in semiconductors (ICDS-15).
- Dates
- 22-26 Aug 1988.
- Place
- Budapest (Hungary).
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- Switzerland
- INIS RN
- 20062071
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPUTERIZED SIMULATION; ETCHING; FLUORINE; SILICON; SURFACES
- Descriptors DEC
- ELEMENTS; HALOGENS; NONMETALS; SEMIMETALS; SIMULATION