Published 1989 | Version v1
Journal article

Fluorine-silicon reactions and the etching of crystalline silicon

  • 1. IBM Research Div., Yorktown Heights, NY (USA)

Description

The interaction between fluorine atoms and crystalline silicon, which is essential for etching processes in semiconductor device fabrication, is investigated with state-of-the-art theoretical techniques. A comprehensive picture of F reactions with the Si surface, the bulk, and the near-surface region is obtained, in terms of which the etching process is elucidated. (author) 7 refs., 1 fig

Additional details

Publishing Information

Journal Title
Materials Science Forum
Journal Volume
38-41
Series
Mater. Sci. Forum.
Journal Page Range
335-339
ISSN
0255-5476
CODEN
MSFOE

Conference

Title
15. International conference on defects in semiconductors (ICDS-15).
Dates
22-26 Aug 1988.
Place
Budapest (Hungary).

INIS

Country of Publication
Switzerland
Country of Input or Organization
Switzerland
INIS RN
20062071
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COMPUTERIZED SIMULATION; ETCHING; FLUORINE; SILICON; SURFACES
Descriptors DEC
ELEMENTS; HALOGENS; NONMETALS; SEMIMETALS; SIMULATION