Published June 30, 2012 | Version v1
Journal article

Study of the growth of infrared-transparent non-spheric layer lenses by continuous-wave laser deposition

  • 1. Department of Condensed Matter Physics, Faculty of Sciences, University of Cadiz, 11.510 — Puerto Real (Cadiz), Andalusia (Spain)
  • 2. Department of System Engineering and Automatics, Electronic Technology and Electronics, School of Engineering, University of Cadiz, 11.002 — Cadiz, Andalusia (Spain)

Description

The fabrication of non-spheric microns-thick layer lenses by continuous-wave laser deposition has been monitored by using an interferometric method. An infrared-transparent amorphous chalcogenide alloy has been used as base material. Results evidence the thermodynamic nature of this laser-assisted deposition process, with two distinct stages occurring in the deposition rates, namely, a first induction stage with thickness increasing at non-constant rate, and a second steady-state stage with thickness increasing at constant rate. The deposition process has been shown to be reproducible and it allows the tailoring of the thickness profile for promising fabrication of non-spheric layer lenses and free-form optics. - Highlights: ► Fabrication of non-spheric layer lenses by continuous-wave laser deposition. ► Infrared-transmitting base material used. ► Monitoring of the fabrication process by interferometric method. ► Results reproducible and promising for tailoring the thickness profile. ► Potential fabrication of free-form optics by this method.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2012.04.068

Additional details

Identifiers

DOI
10.1016/j.tsf.2012.04.068;
PII
S0040-6090(12)00529-9;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
520
Journal Issue
17
Journal Page Range
p. 5512-5515
ISSN
0040-6090
CODEN
THSFAP

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43108416
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALLOYS; DEPOSITION; INTERFEROMETRY; LASERS; LAYERS; LENSES; MATERIALS; MONITORING; THICKNESS
Descriptors DEC
DIMENSIONS

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.