Published 1993
| Version v1
Book
Single event upsets in microelectronics and similar radiation effects in biological systems
Description
Single event upsets are changes in the information stored in microelectronic circuits caused by single-particle interactions which do not damage the device. They belong to a group of soft error phenomena which appear to obey a simple first-order model of threshold response. Biological phenomena which are candidates for that group are the light flashes experienced by astronauts and somatic mutations in biological cells. (author). 25 refs, 10 figs
Additional details
Publishing Information
- Publisher
- World Scientific.
- Imprint Place
- Singapore (Singapore)
- ISBN
- 981-02-1226-7
- Imprint Title
- Radon monitoring in radioprotection, environmental and/or earth sciences
- Imprint Pagination
- 674 p.
- Journal Page Range
- p. 228-246.
Conference
- Title
- 2. workshop on radon monitoring in radioprotection, environmental and/or earth sciences.
- Dates
- 25 Nov - 6 Dec 1991.
- Place
- Trieste (Italy).
INIS
- Country of Publication
- Singapore
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 24057435
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BIOLOGICAL MODELS; COSMIC PROTONS; CROSS SECTIONS; FAILURES; HEAVY IONS; MICRODOSIMETRY; MICROELECTRONIC CIRCUITS; MONTE CARLO METHOD; PHYSICAL RADIATION EFFECTS
- Descriptors DEC
- BARYONS; CALCULATION METHODS; CATIONS; CHARGED PARTICLES; COSMIC RADIATION; DOSIMETRY; ELECTRONIC CIRCUITS; ELEMENTARY PARTICLES; FERMIONS; HADRONS; HYDROGEN IONS; HYDROGEN IONS 1 PLUS; IONIZING RADIATIONS; IONS; NUCLEONS; PROTONS; RADIATION EFFECTS; RADIATIONS