Published May 19, 2003 | Version v1
Journal article

In situ photoemission characterization of terminating-layer-controlled La0.6Sr0.4MnO3 thin films

  • 1. Materials and Structures Laboratory, Tokyo Institute of Technology, Yokohama 226-8503 (Japan)
  • 2. Institute for Materials Research, Tohoku University, Sendai 980-812 (Japan)
  • 3. Institute for Solid State Physics, The University of Tokyo, Kashiwa 277-8581, (Japan)
  • 4. Department of Applied Chemistry, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656 (Japan)

Description

We report on the fabrication of terminating-layer-controlled La0.6Sr0.4MnO3 (LSMO) thin films and in situ characterization of the films using photoemission spectroscopy. The terminating layer of the LSMO films was changed from B to A site by inserting one atomic layer of SrO between the LSMO film and a TiO2-terminated SrTiO3(001) substrate. The successful control of the terminating layer was confirmed by measuring the angular dependence of core-level spectra. Detailed analysis of the Sr 3d core levels revealed considerable differences in chemical bonding states of Sr atoms in the surface regions of films with different terminating layers

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
82
Journal Issue
20
Journal Page Range
p. 3430-3432
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
(c) 2003 American Institute of Physics.