Published December 12, 2011
| Version v1
Journal article
Mechanism of Charge Transport in Cobalt and Iron Phthalocyanine Thin Films Grown by Molecular Beam Epitaxy
- 1. Technical Physics Division, Bhabha Atomic Research Centre, Mumbai 400 085 (India)
Description
Cobalt phthalocyanine (CoPc), iron phthalocyanine (FePc) and their composite (CoPc-FePc) films have been grown by molecular beam epitaxy (MBE). Grazing incidence X-ray diffraction (GIXRD) and scanning electron microscope (SEM) studies showed that composite films has better structural ordering compared to individual CoPc and FePc films. The temperature dependence of resistivity (in the temperature range 25 K- 100 K) showed that composite films are metallic, while individual CoPc and FePc films are in the critical regime of metal-to-insulator (M-I) transition The composite films show very high mobility of 110 cm2 V-1 s-1 at room temperature i.e. nearly two order of magnitude higher compared to pure CoPc and FePc films.
Additional details
Identifiers
- DOI
- 10.1063/1.3653597;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1393
- Journal Issue
- 1
- Journal Page Range
- p. 15-18
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- International conference on advances in condensed and nano materials
- Acronym
- ICACNM-2011
- Dates
- 23-26 Feb 2011
- Place
- Chandigarh (India)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43090998
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CARRIER MOBILITY; CHARGE TRANSPORT; COBALT COMPLEXES; COBALT COMPOUNDS; COMPOSITE MATERIALS; IRON COMPOUNDS; MOLECULAR BEAM EPITAXY; SCANNING ELECTRON MICROSCOPY; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0013-0065 K; TEMPERATURE RANGE 0065-0273 K; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; COMPLEXES; CRYSTAL GROWTH METHODS; DIFFRACTION; ELECTRON MICROSCOPY; EPITAXY; FILMS; MATERIALS; MICROSCOPY; MOBILITY; SCATTERING; TEMPERATURE RANGE; TRANSITION ELEMENT COMPLEXES; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- (c) 2011 American Institute of Physics