Published February 2021
| Version v1
Journal article
Influences of hydrogen ion irradiation on NcVsi− formation in 4H-silicon carbide
- 1. Saitama University, Graduate School of Science and Engineering, Saitama (Japan)
- 2. National Institutes for Quantum and Radiological Science and Technology (QST), Takasaki, Gunma (Japan)
- 3. National Institute of Advanced Industrial Science and Technology (AIST), Tukuba, Ibaraki (Japan)
Description
Nitrogen-vacancy (NCVSi−) center in 4H-SiC is spin defect with near-infrared luminescence at room temperature and a promising candidate for quantum technologies. This paper reports on NCVSi− center formation in N-doped 4H-SiCs by hydrogen ion irradiation and subsequent thermal annealing. It is revealed photoluminescence for NCVSi− centers suddenly appears above the fluence of 5.0 × 1015 cm−2 when annealed at 1000 °C. Appearance of a threshold fluence for their formation and/or activation has not been observed for other energetic particle irradiations. The possible mechanism is discussed based on the kinetics of hydrogen-related complexes and the majority carrier depletion caused by irradiation induced damage. (author)
Availability note (English)
Available from DOI: https://doi.org/10.35848/1882-0786/abdc9eAdditional details
Identifiers
Publishing Information
- Journal Title
- Applied Physics Express (Online)
- Journal Volume
- 14
- Journal Issue
- 2
- Journal Page Range
- p. 021004.1-021004.4
- ISSN
- 1882-0786
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 52110275
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANNEALING; COMPUTERIZED SIMULATION; HIGH SPIN STATES; HYDROGEN IONS; IRRADIATION; MONTE CARLO METHOD; NITROGEN; PHOTOLUMINESCENCE; PROTON BEAMS; QUANTUM SYSTEMS; REFRACTIVE INDEX; SILICON CARBIDES; SPIN; T CODES; VACANCIES
- Descriptors DEC
- ANGULAR MOMENTUM; BEAMS; CALCULATION METHODS; CARBIDES; CARBON COMPOUNDS; CHARGED PARTICLES; COMPUTER CODES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELEMENTS; EMISSION; ENERGY LEVELS; HEAT TREATMENTS; IONS; LUMINESCENCE; NONMETALS; NUCLEON BEAMS; OPTICAL PROPERTIES; PARTICLE BEAMS; PARTICLE PROPERTIES; PHOTON EMISSION; PHYSICAL PROPERTIES; POINT DEFECTS; SILICON COMPOUNDS; SIMULATION
Optional Information
- Notes
- 26 refs., 3 figs.