Published 1985 | Version v1
Book

Electron-beam diagnostics from X-ray emission by a plasma source

  • 1. PRIFIP (CONICET-UBA), FCEN, Pabellon 1, C.Universitaria, 1428 Buenos Aires

Description

The authors describe an improved version of a method for the indirect measurement of electron-beam (EB) parameters from the X-rays emitted by a plasma source in the range 1 - 500 keV. This emission is typical of the EB-target interaction in such devices as the Plasma Focus, where electrons are accelerated to energies above 100 keV/sup 2/, a range where bremsstrahlung (BS) is the dominant emission process. Due to the collective acceleration of positive ions, EB intensities measured far from the source represent lower bounds to those existing at the hot plasma (e.g. the focus). The authors assume that the EB energy distribution in the source can be described as a maxwellian of unidirectional beams with a mean kinetic energy U and energy spread T. By using recent numerical fits of the best BS predictions available they calculate the intensity of photons with energy k emitted at an angle θ (from beam axis) by EBs with parameters

Additional details

Publishing Information

Publisher
IEEE Service Center.
Imprint Place
Piscataway, NJ (USA)
Imprint Title
Conference record of the 1985 IEEE international conference on plasma science
Journal Page Range
p. 23.

Conference

Title
Conference on plasma sciences.
Dates
3-5 Jun 1985.
Place
Pittsburgh, PA (USA).

INIS