The diagnosis method for high-energy ion beams using backscattered particles for laser-driven ion acceleration experiments

A single CR-39 detector mounted on plastic plates is irradiated with a 100 MeV He ion beam. Although the beam energy is much greater than the detection threshold limit of the CR-39 detector, a large number of etch pits having elliptical openings are observed on the rear surface. Detailed investigations reveal that these etch pits are created by heavy ions inelastically backscattered from the plastic plates. This method allows a simple diagnosis of the ion beam profile and the presence of the high-energy component beyond the detection threshold limit of the CR-39 detector, especially in mixed-radiation fields such as laser-driven ion acceleration experiments. (author)