Electronic structure of strongly reduced ( 1 ‾ 1 1 ) surface of monoclinic HfO 2
- 1. Center for Integrated Computational Materials Engineering, International Research Institute for Multidisciplinary Science, Beihang University, Beijing 100191 (China)
- 2. School of Materials Science and Engineering, Beihang University, Beijing 100191 (China)
Description
Highlights: • Oxygen vacancy (Vo) tends to segregate onto the surface and attracts each other when forming pairs, enabling the possibility of developing a Vo-controlled functional area/device on the surface. • In this work, a conductivity-stability dilemma for the surface Vo-chains is found, and a semiconductor to metal transition is demonstrated in metastable Vo-chain with formation energy increased by 0.25 eV per Vo. • Application of Hubbard U correction to Density Functional Theory is necessary when discussing the conductance mechanism (metallic/semiconducting/polaron-hopping) of Vo-contained HfO2. Material surface is playing an increasingly important role in electronic devices as their size down to nanoscale. Here, by first-principles calculations we studied the surface oxygen-vacancies (Vos) induced electronic-structure variation of , in order to explore its potential applications in surface-controlled electronic devices. Firstly, it is found that single Vo tends to segregate onto the surface and attracts each other as they form pairs, making the formation of vacancies-contained functional surface possible. Then extensive Vo-chains whose formation/rupture can represent the high/low conductivity state are constructed. The electronic states induced by the Vos remain localized in the band-gap region for most of the Vo-chains studied here. A transition to a metallic conductance is found in metastable Vo-chain with formation energy increased by 0.25 eV per Vo. Moreover, we highlight the significance of the Hubbard U correction for density functional theory when studying the electronic-structure based conductance in the oxides. By comprehensive calculations, we find a conductivity-stability dilemma of the Vo-chains, providing guideline for understanding and designing the electronic devices based on surface.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2018.03.234Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2018.03.234;
- PII
- S0169433218309309;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 447
- Journal Page Range
- p. 618-626
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54056060
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CORRECTIONS; DENSITY FUNCTIONAL METHOD; ELECTRONIC EQUIPMENT; ELECTRONIC STRUCTURE; FORMATION HEAT; HAFNIUM OXIDES; METALS; MONOCLINIC LATTICES; NANOSTRUCTURES; POLARONS; RECOMMENDATIONS; RUPTURES; SEMICONDUCTOR MATERIALS; STABILITY; VACANCIES
- Descriptors DEC
- CALCULATION METHODS; CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; ELEMENTS; ENTHALPY; EQUIPMENT; FAILURES; HAFNIUM COMPOUNDS; MATERIALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; POINT DEFECTS; QUASI PARTICLES; REACTION HEAT; REFRACTORY METAL COMPOUNDS; THERMODYNAMIC PROPERTIES; THREE-DIMENSIONAL LATTICES; TRANSITION ELEMENT COMPOUNDS; VARIATIONAL METHODS
Optional Information
- Copyright
- Copyright (c) 2018 Elsevier B.V. All rights reserved.