Published January 14, 2004
| Version v1
Journal article
Photoemission study of EuS/PbS electronic structure
Description
The ultraviolet photoemission and resonant photoemission spectroscopy were used to study the electronic structure of EuS/PbS multilayers with the contribution of europium's 4f orbitals to the density of states of the valence band. The valence band photoemission spectra of galena and europium monosulfide layers show good agreement with theoretical density of state computations. The relative ratio of Eu3+ and Eu2+ ions located at the surface of EuS layer strongly depends on conditions of preparation procedures of the sample surface. For the buried EuS layer only Eu2+ ions were observed
Additional details
Identifiers
- DOI
- 10.1016/S0925-8388;
- PII
- S0925838803005838;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 362
- Journal Issue
- 1-2
- Journal Page Range
- p. 198-201
- ISSN
- 0925-8388
- CODEN
- JALCEU
Conference
- Title
- 6. international school and symposium on synchrotron radiation in natural science (ISSRNS)
- Dates
- 17-22 Jun 2002
- Place
- Ustron-Jaszowiec (Poland)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37047848
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DEPOSITION; ELECTRONIC STRUCTURE; EMISSION SPECTRA; EUROPIUM IONS; EUROPIUM SULFIDES; GALENA; IMPURITIES; INTERFACES; LAYERS; LEAD SULFIDES; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; SEMICONDUCTOR MATERIALS; SURFACES; ULTRAVIOLET RADIATION; VALENCE; VAPORS
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLES; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; EMISSION; EUROPIUM COMPOUNDS; FLUIDS; GASES; IONS; LEAD COMPOUNDS; MATERIALS; MINERALS; RADIATIONS; RARE EARTH COMPOUNDS; SECONDARY EMISSION; SPECTRA; SPECTROSCOPY; SULFIDE MINERALS; SULFIDES; SULFUR COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.