Published August 1993 | Version v1
Report

Solid State Technology Branch of NASA Lewis Research Center: Fifth Annual Digest

Description

An extensive characterization of Bi-Sr-Ca-Cu-O (BSCCO) thin films deposited by co-evaporation on LaAlO3 and SrTiO3 substrates was performed. The films had a Tc (R = O) of approximately 78 K, and were predominantly c-axis oriented, with critical current densities (Jc) at 4.5 K of 1.6 x 10(exp 6) and 1.1 x 10(exp 6) A cm-2, for the samples on SrTiO3 and LaAlO3, respectively. The microwave properties of the films were examined by three techniques. The complex conductivity sigma* = sigma1 - j(sigma2) and the magnetic penetration depth (A) were measured by power transmission at 30.6 GHz; the surface resistance (Rs) was measured using a cavity resonator at 58.9 GHz, and the transmission line losses were determined by measuring the quality factor (Q) of a linear microstrip resonator at 10.4 and 20.2 GHz. The complex conductivity for the film on LaAlO3 was determined to be (2.0-j10) x 10(exp 5) S/m at 77 K. It was observed that in the superconducting state sigma1 deviates from both the Bardeen-Cooper-Schrieffer (BCS) theory and the two-fluid model. Values of lambda were found to be approximately 2.0 and 1.1 microns at 77 K and 20 K respectively, and were obtained for the film on LaAlO3. The value of lambda at 20 K was approximately three times larger than that of BSCCO single crystals. Rs values of 865 and 1391 mOmega were obtained for the films on SrTiO3 and LaAlO3, respectively, at 77 K and 58.9 GHz. Unloaded Q factors at 20 K of approximately 1100 and 800 at 10.4 and 20.2 GHz respectively, were measured for the BSCCO resonator. Unloaded Q values of 290 and 405 at 20 K were obtained at 10.4 GHz and 20.2 GHz respectively, for an all gold (Au) resonator

Availability note (English)

MF available from INIS under the Report Number; Also available from CASI HC A02/MF A03.

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Publishing Information

Imprint Pagination
8 p.
Report number
N--94-20497

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