Published April 2018 | Version v1
Journal article

Electron irradiation degradation of AlGaInP/GaAs light-emitting diodes

  • 1. National Research Tomsk State University, Tomsk (Russian Federation)
  • 2. National Research Nuclear University MEPhi, Moscow (Russian Federation)
  • 3. F.M. Stelmakh Research Institute ''Polyus'', Moscow (Russian Federation)

Description

Red and yellow AlGaInP/GaAs light-emitting diodes (LEDs) with multiple quantum wells grown by the metalorganic chemical vapor deposition technique were irradiated at room temperature by 10 MeV electrons at fluences of 1012 - 1016 cm-2. The damage constants of the minority carrier lifetime and the light-output reach the values of (1-2.5) x 10-14 cm2 at room temperature measurements. At the same time, the radiation tolerance of these diodes increases up to 50 times when the temperature is lowered down to 16 K. The beneficial effect of the Mg doping of the p-GaP(Mg) window layer on the LEDs radiation tolerance at a high forward current density has been demonstrated. (copyright 2018 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)

Availability note (English)

Available from: http://dx.doi.org/10.1002/pssa.201700445

Additional details

Identifiers

Publishing Information

Journal Title
Physica Status Solidi A. Applications and Materials Science (Online)
Journal Volume
215
Journal Issue
8
Journal Page Range
p. 1-5
ISSN
1862-6319

Optional Information

Notes
With 9 figs., 1 tab.