Effect of open air annealing on spin coated aluminum doped ZnO nanostructure
Creators
Description
Aluminum doped ZnO thin film nanostructures were prepared by spin coating deposition on glass and silicon substrates. Electrical, optical and structural properties of these films were analyzed in order to investigate their dependence on post annealing temperature and number of coating cycles. Ultraviolet–Visible spectrophotometry and X-Ray diffraction (XRD) analysis confirmed that the films are optically transparent and polycrystalline in nature. Scanning electron microscopy (SEM) reveals worm like homogeneous morphology. Chemical analysis was carried out by Fourier transform infrared spectroscopy (FTIR). Atomic force microscopy (AFM) showed mountain and valley like nanostructure. Optimized films with a low resistivity of 2.11 × 10−1 Ω cm were obtained at open air annealing temperature of 375 °C. - Highlights: • Aluminum doped ZnO thin film nanostructures were prepared by sol–gel deposition. • Optimized film nanostructures with a low resistivity of 2.11 × 10−1 Ω-cm were obtained. • Atomic force microscopy (AFM) shows mountain and valley like nanostructure
Availability note (English)
Available from http://dx.doi.org/10.1016/j.matchemphys.2013.04.027Additional details
Identifiers
- DOI
- 10.1016/j.matchemphys.2013.04.027;
- PII
- S0254-0584(13)00349-0;
Publishing Information
- Journal Title
- Materials Chemistry and Physics
- Journal Volume
- 141
- Journal Issue
- 1
- Journal Page Range
- p. 81-88
- ISSN
- 0254-0584
- CODEN
- MCHPDR
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45108810
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; DOPED MATERIALS; FOURIER TRANSFORM SPECTROMETERS; GLASS; INFRARED SPECTRA; MOUNTAINS; NANOSTRUCTURES; POLYCRYSTALS; SCANNING ELECTRON MICROSCOPY; SPECTROPHOTOMETRY; SPIN; SPIN-ON COATING; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION; ZINC OXIDES
- Descriptors DEC
- ANGULAR MOMENTUM; CHALCOGENIDES; COHERENT SCATTERING; CRYSTALS; DEPOSITION; DIFFRACTION; ELECTRON MICROSCOPY; FILMS; HEAT TREATMENTS; MATERIALS; MEASURING INSTRUMENTS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PARTICLE PROPERTIES; SCATTERING; SPECTRA; SPECTROMETERS; SURFACE COATING; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.