Published 2005 | Version v1
Journal article Metadata-only

Linear accelerator mass spectrometry with PIXE calibration

Creators

  • 1. Tokyo Inst. of Technology, Research Lab. for Nuclear Reactors, Tokyo (Japan)
  • 2. Tokyo Inst. of Technology, Dept. of Physics, Tokyo (Japan)
  • 3. Tokyo Inst. of Technology, Graduate School of Science and Engineering, Tokyo (Japan)

Description

AMS is commonly used in radioisotope analysis because it can detect isotopes down to levels of 10-15 by abundance, but applications for trace element analysis are few. Therefore, we propose a new kind of AMS for trace element analysis using a linear accelerator (LINAC), an Electron Cyclotron Resonance Ion Source (ECRIS), and calibration methods with PIXE analysis. Abundance ratios of each element measured by PIXE are applied to create distribution charts of particles and charge states, and these charts are used for quantitative analysis. We report the concepts behind our AMS and calibration methods in this paper. (author)

Additional details

Publishing Information

Journal Title
International Journal of PIXE
Journal Volume
15
Journal Issue
1-2
Journal Page Range
p. 11-17
ISSN
0129-0835

Conference

Title
21. symposium on PIXE in Japan; 12. annual meeting of the Japan Society for Particle Induced X-ray Emission (PIXE) Research
Dates
15-17 Nov 2004
Place
Tokyo (Japan)

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
37047574
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CALIBRATION; ECR ION SOURCES; ELECTRON CYCLOTRON-RESONANCE; ELEMENTS; LINEAR ACCELERATORS; MASS SPECTROMETERS; MASS SPECTROSCOPY; PIXE ANALYSIS; QUANTITATIVE CHEMICAL ANALYSIS; TRACE AMOUNTS
Descriptors DEC
ACCELERATORS; CHEMICAL ANALYSIS; CYCLOTRON RESONANCE; ION SOURCES; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; RESONANCE; SPECTROMETERS; SPECTROSCOPY; X-RAY EMISSION ANALYSIS

Optional Information

Notes
10 refs., 4 figs., 3 tabs.