Published December 2012 | Version v1
Journal article Metadata-only

Influence of Oxygen Partial Pressure on the Fermi Level of ZnO Films Investigated by Kelvin Probe Force Microscopy

Creators

  • 1. Department of Mechanical Engineering, National University of Singapore, 9 Engineering Drive 1, Singapore 117576 (Singapore)
  • 2. Department of Physics, Jiamusi University, Jiamusi 154007 (China)

Description

The influence of oxygen partial pressure on the Fermi level of ZnO films prepared by pulsed laser deposition is investigated. The contact potential difference of the ZnO films fabricated under various oxygen partial pressures is studied systematically using Kelvin probe force microscopy. The Fermi level shifted by 0.35 eV as oxygen partial pressure increased. This indicates a significant change in the electronic structure and energy balance in ZnO films. This fact provides a consistent explanation that the changes in carrier concentration, resistivity and mobility of ZnO films are attributed to oxygen vacancy induced shift of the Fermi level

Availability note (English)

Available from http://dx.doi.org/10.1088/0256-307X/29/12/127102

Additional details

Identifiers

DOI
10.1088/0256-307X/29/12/127102;

Publishing Information

Journal Title
Chinese Physics Letters
Journal Volume
29
Journal Issue
12
Journal Page Range
[3 p.]
ISSN
0256-307X
CODEN
CPLEEU

INIS

Country of Publication
China
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45003322
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
CARRIER MOBILITY; CONCENTRATION RATIO; ELECTRIC CONDUCTIVITY; ELECTRONIC STRUCTURE; ENERGY BEAM DEPOSITION; EV RANGE; FERMI LEVEL; LASER RADIATION; MICROSCOPY; OXYGEN; PARTIAL PRESSURE; PRESSURE DEPENDENCE; PULSED IRRADIATION; THIN FILMS; VACANCIES; ZINC OXIDES
Descriptors DEC
CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DEPOSITION; DIMENSIONLESS NUMBERS; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY LEVELS; ENERGY RANGE; FILMS; IRRADIATION; MOBILITY; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; POINT DEFECTS; RADIATIONS; SURFACE COATING; THERMODYNAMIC PROPERTIES; ZINC COMPOUNDS