Published February 1974 | Version v1
Journal article

Encapsulation of high-purity germanium detectors

  • 1. Univ. of California, Livermore

Description

The encapsulation of high purity germanium detectors is very desirable in order to increase their versatility and reliability. However, rapid and extensive degradation is seen for all detectors made from detector grade crystals which are encapsulated in a simple vacuum. Extensive studies have shown that the cause of this degradation is hydrogen adsorption on the detector surface. There it causes the formation of a strong p+ inversion layer which in turn shunts the detector junction. Reliable encapsulation is shown to be achievable by the use of hydrogen-free germanium crystals.

Additional details

Identifiers

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
21
Journal Issue
1
Series
IEEE (Inst. Elec. Electron. Eng.), Trans. Nucl. Sci.
Journal Page Range
344-346
ISSN
0018-9499

Conference

Title
20. nuclear science symposium and 5. nuclear power systems symposium.
Dates
14 Nov 1973.
Place
San Francisco, CA.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
5144179
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ADSORPTION; FABRICATION; GE SEMICONDUCTOR DETECTORS; HYDROGEN; SURFACES
Descriptors DEC
ELEMENTS; MEASURING INSTRUMENTS; NONMETALS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS

Optional Information

Notes
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