Published February 1, 2011 | Version v1
Journal article

Optical properties of BiFeO3 and Bi0.9La0.1 FeO3 films on silicon substrates

  • 1. Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of electronics, East China Normal University, 500 Dongchuan Road, Shanghai 200241 (China)
  • 2. Key Laboratory for Material Microstructures of Shanghai University, Shanghai University, 99 Shangda Rd, Shanghai 200444 (China)

Description

BiFeO3 (BFO) and Bi0.9La0.1FeO3 (BLFO) thin films were deposited on Si (100) wafer by sol-gel technique. The microstructure and surface morphology of the films were characterized using X-ray diffraction and atomic force microscope. After annealing at 600 deg. C, all the films were well-crystallized, and the diffraction peaks corresponded to BFO standard pattern quite well. The optical properties of BFO and BLFO film were studied by spectroscopic ellipsometry in the wavelength range 420 to1700 nm. Compared with the BFO film, the BLFO film has lower refraction index and higher extinction coefficient in the wavelength range 600 to 1700 nm. The absorption coefficient of the BLFO film is greater than 1700cm-1 in total measured wavelength region. The results suggest that the potential role of La dopant improved the optical properties of BFO thin film and the BLFO film is a promising material for photovoltaic devices.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/276/1/012168

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
276
Journal Issue
1
Journal Page Range
[5 p.]
ISSN
1742-6596

Conference

Title
3. international Photonics and OptoElectronics Meetings
Acronym
POEM 2010
Dates
2-5 Nov 2010
Place
Wuhan (China)