Published 1985
| Version v1
Book
Multilayer X-ray mirrors prepared by triode sputtering using a new method of film thickness monitoring
- 1. Paris-6 Univ., 75 (France). Lab. de Chimie Physique
- 2. Centre National de la Recherche Scientifique, 92 - Meudon-Bellevue (France)
Description
no abstract available
Additional details
Publishing Information
- Publisher
- CEP Consultants Ltd.
- Imprint Place
- Edinburgh (UK)
- Imprint Title
- IPAT 85
- Imprint Pagination
- 507 p.
- Journal Page Range
- p. 404.
Conference
- Title
- 5. international conference.
- Acronym
- Ion and plasma assisted techniques
- Dates
- May 1985.
- Place
- Munich (Germany, F.R.).
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 18058791
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- BRAGG REFLECTION; CARBON; DEPOSITION; EV RANGE 100-1000; MICROPROCESSORS; OPTICAL PROPERTIES; SPUTTERING; THICKNESS; THIN FILMS; TRIODE TUBES; TUNGSTEN; ULTRAVIOLET RADIATION; X RADIATION
- Descriptors DEC
- DIMENSIONS; ELECTROMAGNETIC RADIATION; ELECTRON TUBES; ELECTRONIC CIRCUITS; ELEMENTS; ENERGY RANGE; EV RANGE; FILMS; IONIZING RADIATIONS; METALS; MICROELECTRONIC CIRCUITS; NONMETALS; PHYSICAL PROPERTIES; RADIATIONS; REFLECTION; TRANSITION ELEMENTS
Optional Information
- Notes
- Abstract only.