Published May 1982
| Version v1
Journal article
Influence of the edge field of a quadrupole mass spectrometer on a charged-particle beam
Creators
- 1. Scientific and Technical Union, Institute of Analytical Instrument Design, Academy of Sciences of the USSR, Leningrad
Description
Functional relations are obtained for the parameters of a divergent beam of charged particles leaving a point, in the region of the edge field of a quadrupole mass spectrometer, as a function of the parameters of this device and the potential, assuming that the edge field potential varies linearly in the direction parallel to the electrodes of the device
Additional details
Publishing Information
- Journal Title
- Sov. Phys. - Tech. Phys. (Engl. Transl.)
- Journal Volume
- 27
- Journal Issue
- 5
- Series
- Sov. Phys. - Tech. Phys. (Engl. Transl.).
- Journal Page Range
- 606-608
- ISSN
- 0038-5662
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 14797199
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- BEAM OPTICS; ELECTRIC FIELDS; ELECTRODES; ION BEAMS; IONS; MASS SPECTROMETERS; QUADRUPOLES; SENSITIVITY; SPECIFICATIONS; TRAJECTORIES
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; MEASURING INSTRUMENTS; MULTIPOLES; SPECTROMETERS
Optional Information
- Notes
- Cover-to-cover translation of Zhurnal Tekhnicheskoj Fiziki (USSR).