Published October 1, 2008 | Version v1
Journal article

Field emission from a selected multiwall carbon nanotube

  • 1. Dipartimento di Fisica, Universita degli Studi dell'Aquila and INFN and CNR-INFM Laboratorio Regionale CASTI, Via Vetoio, 67010 Coppito (Italy)
  • 2. Dipartimento di Fisica ER Caianiello, and CNR-INFM Laboratorio Regionale SUPERMAT, and Centro Interdipartimentale NanoMateS, Universita degli Studi di Salerno, and INFN Gruppo Collegato di Salerno, Via S Allende, 84081 Baronissi (Italy)

Description

The electron field emission characteristics of individual multiwalled carbon nanotubes were investigated by a piezoelectric nanomanipulation system operating inside a scanning electron microscopy chamber. The experimental set-up ensures a precise evaluation of the geometric parameters (multiwalled carbon nanotube length and diameter and anode-cathode separation) of the field emission system. For several multiwalled carbon nanotubes, reproducible and quite stable emission current behaviour was obtained, with a dependence on the applied voltage well described by a series resistance modified Fowler-Nordheim model. A turn-on field of ∼30 V μm-1 and a field enhancement factor of around 100 at a cathode-anode distance of the order of 1 μm were evaluated. Finally, the effect of selective electron beam irradiation on the nanotube field emission capabilities was extensively investigated

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-4484/19/39/395701

Additional details

Identifiers

DOI
10.1088/0957-4484/19/39/395701;
PII
S0957-4484(08)79301-2;

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
19
Journal Issue
39
Journal Page Range
[6 p.]
ISSN
0957-4484

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39113018
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ANODES; CARBON; CATHODES; ELECTRON BEAMS; FIELD EMISSION; IRRADIATION; NANOTUBES; PIEZOELECTRICITY; SCANNING ELECTRON MICROSCOPY
Descriptors DEC
BEAMS; ELECTRICITY; ELECTRODES; ELECTRON MICROSCOPY; ELEMENTS; EMISSION; LEPTON BEAMS; MICROSCOPY; NANOSTRUCTURES; NONMETALS; PARTICLE BEAMS