Field emission from a selected multiwall carbon nanotube
Creators
- 1. Dipartimento di Fisica, Universita degli Studi dell'Aquila and INFN and CNR-INFM Laboratorio Regionale CASTI, Via Vetoio, 67010 Coppito (Italy)
- 2. Dipartimento di Fisica ER Caianiello, and CNR-INFM Laboratorio Regionale SUPERMAT, and Centro Interdipartimentale NanoMateS, Universita degli Studi di Salerno, and INFN Gruppo Collegato di Salerno, Via S Allende, 84081 Baronissi (Italy)
Description
The electron field emission characteristics of individual multiwalled carbon nanotubes were investigated by a piezoelectric nanomanipulation system operating inside a scanning electron microscopy chamber. The experimental set-up ensures a precise evaluation of the geometric parameters (multiwalled carbon nanotube length and diameter and anode-cathode separation) of the field emission system. For several multiwalled carbon nanotubes, reproducible and quite stable emission current behaviour was obtained, with a dependence on the applied voltage well described by a series resistance modified Fowler-Nordheim model. A turn-on field of ∼30 V μm-1 and a field enhancement factor of around 100 at a cathode-anode distance of the order of 1 μm were evaluated. Finally, the effect of selective electron beam irradiation on the nanotube field emission capabilities was extensively investigated
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-4484/19/39/395701Additional details
Identifiers
- DOI
- 10.1088/0957-4484/19/39/395701;
- PII
- S0957-4484(08)79301-2;
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 19
- Journal Issue
- 39
- Journal Page Range
- [6 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39113018
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANODES; CARBON; CATHODES; ELECTRON BEAMS; FIELD EMISSION; IRRADIATION; NANOTUBES; PIEZOELECTRICITY; SCANNING ELECTRON MICROSCOPY
- Descriptors DEC
- BEAMS; ELECTRICITY; ELECTRODES; ELECTRON MICROSCOPY; ELEMENTS; EMISSION; LEPTON BEAMS; MICROSCOPY; NANOSTRUCTURES; NONMETALS; PARTICLE BEAMS