Published January 1990 | Version v1
Journal article

Scattering recoil coincidence spectrometry

  • 1. Atomic Energy of Canada Ltd., Chalk River Nuclear Labs., Ontario
  • 2. Dept. of Physics, Queen's Univ., Kingston, Ontario (Canada)

Description

The new technique for profiling light elements in thin, self-supporting foils, which uses a coincidence measurement over very large solid angles, has been demonstrated experimentally. A beam of 2.0 MeV 4He particles was used to bombard films of (i) cracked ethylene and (ii) evaporated carbon which was subsequently implanted with 7.5 keV 1H+ ions to a concentration of 1017/cm2. Plots of Eα vs Ep clearly show the 1H distributions in the foil. (orig.)

Additional details

Additional titles

Subtitle (English)
A new experimental technique for profiling hydrogen isotopes in low-Z thin films

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research, Section B
Journal Volume
45
Journal Issue
1-4
Series
Nucl. Instrum. Methods Phys. Res., Sect. B.
Journal Page Range
176-180
ISSN
0168-583X
CODEN
NIMBE

Conference

Title
9. international conference on ion beam analysis (IBA-9).
Dates
26-30 Jun 1989.
Place
Kingston (Canada).