Resonance surface X-ray scattering technique to determine the structure of electrodeposited Pt ultrathin layers on Au(1 1 1) surface

It is demonstrated that resonance surface X-ray scattering (RSXS), in which incident X-ray energy close to the Pt LIII absorption edge (11.55 keV) is used, is very useful for the determination of the structure of electrodeposited Pt thin layers on a Au(1 1 1) surface. This technique was applied to characterize the structure of electrodeposited Pt layers on Au(1 1 1) substrates prepared under two extreme conditions, which are known to provide rough and atomically flat layers. Detailed structural information was obtained by RSXS measurements and it was confirmed that the structures of the Pt layers were as reported. Pt atoms of the atomically flat monolayer were found to be situated at the threefold hollow cubic closest packing (ccp) sites of the Au(1 1 1)-(1 x 1) surface.