Published March 2008 | Version v1
Journal article

X-ray absorption spectroscopy study on oxygen-deficient hafnium oxide film

  • 1. Department of Materials Science and Engineering, and Inter-University Semiconductor Research Center, Seoul National University, Seoul 151-742 (Korea, Republic of)
  • 2. Department of Physics and Astronomy, and Center for Strongly Correlated Material Research, Seoul National University, Seoul 151-742 (Korea, Republic of)
  • 3. Pohang Accelerator Laboratory, Pohang University of Science and Technology, Pohang 790-784 (Korea, Republic of)

Description

We investigated the influence of oxygen vacancy on the electronic and atomic distributions in hafnium oxide, using hard and soft x-ray absorption spectroscopies. Analyses on the Hf L3-edge extended x-ray absorption fine structures revealed that the average Hf-O bond length reduces more than -0.1 A in the presence of oxygen vacancy, consequently on the lattice relaxation. Furthermore, the O K-edge absorption spectrum shows additional band tail state beneath the genuine Hf 5d conduction band, which manifests a small occupation in Hf d shell in the oxygen-deficient oxide. However, the nonzero d occupation is found not to involve a ferromagnetic spin correlation by the absence of features in the Hf N3-edge magnetic circular dichroism

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/100/4/042044

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
100
Journal Issue
4
Journal Page Range
[4 p.]
ISSN
1742-6596

Conference

Title
17. international vacuum congress; ICSS-13: 13. international conference on surface science; ICN+T 2007: International conference on nanoscience and technology
Acronym
IVC-17
Dates
2-6 Jul 2007
Place
Stockholm (Sweden)