Published 1995 | Version v1
Book

Recent measurements of electron density profiles of plasmas in PLADIS I, a plasma disruption simulator

  • 1. D.B. Efremov Inst. of Electrophysical Apparatus, St. Petersburg (Russian Federation)
  • 2. Univ. of New Mexico, Albuquerque, NM (United States). Dept. of Electrical and Computer Engineering
  • 3. Sandia National Labs., Albuquerque, NM (United States). Fusion Technology Dept.

Description

Tokamak disruption simulation experiments are being conducted at the University of New Mexico (UNM) using the PLADIS I plasma gun system. PLADIS I is a high power, high energy coaxial plasma gun configured to produce an intense plasma beam. First wall candidate materials are placed in the beam path to determine their response under disruption relevant energy densities. An optically thick vapor shield plasma has been observed to form above the target surface in PLADIS I. Various diagnostics have been used to determine the characteristics of the incident plasma and the vapor shielding plasma. The cross sectional area of the incident plasma beam is a critical characteristic, as it is used in the calculation of the incident plasma energy density. Recently, a HeNe interferometer in the Mach-Zehnder configuration has been constructed and used to probe the electron density of the incident plasma beam and vapor shield plasma. The object beam of the interferometer is scanned across the plasma beam on successive shots, yielding line integrals of beam density on different chords through the plasma. Data from the interferometer is used to determine the electron density profile of the incident plasma beam as a function of beam radius. This data is then used to calculate the effective beam area. Estimates. of beam area, obtained from other diagnostics such as damage targets, calorimeter arrays and off-axis measurements of surface pressure, will be compared with data from the interferometer to obtain a better estimate of the beam cross sectional area

Additional details

Publishing Information

Publisher
Institute of Electrical and Electronics Engineers, Inc.
Imprint Place
New York, NY (United States)
ISBN
0-7803-2669-5
Imprint Title
IEEE conference record -- abstracts: 1995 IEEE international conference on plasma science
Imprint Pagination
312 p.
Journal Page Range
p. 195.

Conference

Title
22. international conference on plasma science.
Dates
5-8 Jun 1995.
Place
Madison, WI (United States).

Optional Information

Secondary number(s)
CONF-950612--.