Published March 21, 2009
| Version v1
Journal article
Femtosecond electron and spin dynamics in ferromagnetic Ni probed by UV and soft X-ray pulses
Creators
- 1. Helmholtz-Zentrum Berlin fuer Materialien und Energie GmbH, Albert-Einstein-Str. 15, 12489 Berlin (Germany)
Description
Experiments are reviewed which extend ultraviolet photoemission and soft X-ray absorption spectroscopy to the femtosecond (fs) time domain. We show for the case of ferromagnetic Ni that the evolution of electronic temperature, exchange coupling, spin and orbital angular momentum following fs optical laser excitation can be individually probed. This provides new insights into ultrafast processes which involve energy and angular momentum transfer between charge, spin and lattice degrees of freedom.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2008.12.118Additional details
Identifiers
- DOI
- 10.1016/j.nima.2008.12.118;
- PII
- S0168-9002(08)02019-6;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 601
- Journal Issue
- 1-2
- Journal Page Range
- p. 132-138
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41031068
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; ANGULAR MOMENTUM TRANSFER; DEGREES OF FREEDOM; ELECTRON-PHONON COUPLING; ELECTRONS; EVOLUTION; EXCITATION; LASERS; ORBITAL ANGULAR MOMENTUM; PHOTOEMISSION; PULSES; SOFT X RADIATION; SPIN; SPIN-LATTICE RELAXATION; ULTRAVIOLET RADIATION
- Descriptors DEC
- ANGULAR MOMENTUM; COUPLING; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; EMISSION; ENERGY-LEVEL TRANSITIONS; FERMIONS; IONIZING RADIATIONS; LEPTONS; MOMENTUM TRANSFER; PARTICLE PROPERTIES; RADIATIONS; RELAXATION; SECONDARY EMISSION; SPECTROSCOPY; X RADIATION
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.