An MWCNT-doped SNO2 thin film NO2 gas sensor by RF reactive magnetron sputtering
Creators
- 1. College of Material Science and Engineering, Fuzhou University, Fuzhou 350002 (China)
Description
An MWCNT-doped (multi-walled carbon nanotube) SnO2 thin film NO2 gas sensor, prepared by radio frequency reactive magnetron sputtering, showed a high sensitivity to ultra-low concentrations of NO2 in the parts per billion range. X-ray diffraction, X-ray photoelectron spectroscopy, and scanning electron microscopy (SEM) characterizations indicated that the MWCNTs were affected by the morphology of the SnO2 thin film and the particle size. The properties of the MWCNT-doped SnO2 sensor, such as sensitivity, selectivity, and response-recovery time, were investigated. Experimental results revealed that the MWCNT-doped SnO2 thin film sensor response to NO2 gas depended on the operating temperature, NO2 gas concentration, thermal treatment conditions, film thickness, and so on. The mechanism of the gas-sensing property of the MWCNT-doped Sn22 thin film sensor was investigated and showed that the improved gas-sensing performance should be attributed to the effects between MWCNTs (p-type) and SnO2 (n-type) semiconductors. (semiconductor devices)
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-4926/31/2/024006Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Semiconductors
- Journal Volume
- 31
- Journal Issue
- 2
- Journal Page Range
- [6 p.]
- ISSN
- 1674-4926
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42071444
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CARBON; DOPED MATERIALS; HEAT TREATMENTS; MAGNETRONS; NANOTUBES; NITROGEN DIOXIDE; PARTICLE SIZE; RADIOWAVE RADIATION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; SENSITIVITY; SENSORS; SPUTTERING; THICKNESS; THIN FILMS; TIN OXIDES; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; MATERIALS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NANOSTRUCTURES; NITROGEN COMPOUNDS; NITROGEN OXIDES; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; RADIATIONS; SCATTERING; SIZE; SPECTROSCOPY; TIN COMPOUNDS