Published March 2008
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Study on Crystallographic Properties of Li Doped ZnO Thin Films
Description
Li-doped ZnO film is prepared on highly polished Si substrate. The process temperature are range from 4000C to 6000C and maintained 1 hr for homogenization. According to the experimental results, it is significant that the growth chemistry is quite feasible and expected to be crystalline at above-mentioned temperatures.
Availability note (English)
Also Published in Journal of the Myanmar Academy of Arts and ScienceFiles
41086851.pdf
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Additional details
Publishing Information
- Imprint Place
- Yangon (Myanmar)
- Imprint Pagination
- 11 p.
- Report number
- INIS-MM--110
INIS
- Country of Publication
- Myanmar
- Country of Input or Organization
- Myanmar
- INIS RN
- 41086851
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CRYSTALLOGRAPHY; DOPED MATERIALS; HOMOGENIZATION METHODS; LITHIUM; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0400-1000 K; THIN FILMS; X-RAY DIFFRACTION; ZINC OXIDES
- Descriptors DEC
- ALKALI METALS; CALCULATION METHODS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELEMENTS; FILMS; MATERIALS; METALS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; TEMPERATURE RANGE; ZINC COMPOUNDS