Published July 15, 1981 | Version v1
Journal article

Interaction between arsenic, hydrogen, and silicon matrix in doping of sputtered amorphous hydrogenated silicon

  • 1. Phase, CNRS, Centre de Recherches Nucleaires 67037 Strasbourg Cedex, France

Description

Simultaneous variations of the concentrations of As, Si, and H in As doped and undoped sputtered a-Si:H structures are reported. The As is substitutional for Si, but most of the As atoms are also connected with an additional hydrogen and so inefficient for doping. The As doping also decreases significantly the material density. These results are shown to reject the usual assumption according to which doping atoms just supply carriers in the otherwise unchanged distribution of states of undoped a-Si:H

Additional details

Publishing Information

Journal Title
Appl. Phys. Lett.
Journal Volume
39
Journal Issue
2
Series
Appl. Phys. Lett.
Journal Page Range
152-154
ISSN
0003-6951

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
12630347
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Numerical Data
Descriptors DEI
AMORPHOUS STATE; CHARGE CARRIERS; COLLISIONS; DENSITY; DISTRIBUTION; DOPED MATERIALS; ENERGY LEVELS; EXPERIMENTAL DATA; HYDROGEN; INTERACTIONS; QUANTITY RATIO; SILICON; SPUTTERING; VARIATIONS
Descriptors DEC
DATA; ELEMENTS; INFORMATION; NONMETALS; NUMERICAL DATA; PHYSICAL PROPERTIES; SEMIMETALS