Published July 15, 1981
| Version v1
Journal article
Interaction between arsenic, hydrogen, and silicon matrix in doping of sputtered amorphous hydrogenated silicon
- 1. Phase, CNRS, Centre de Recherches Nucleaires 67037 Strasbourg Cedex, France
Description
Simultaneous variations of the concentrations of As, Si, and H in As doped and undoped sputtered a-Si:H structures are reported. The As is substitutional for Si, but most of the As atoms are also connected with an additional hydrogen and so inefficient for doping. The As doping also decreases significantly the material density. These results are shown to reject the usual assumption according to which doping atoms just supply carriers in the otherwise unchanged distribution of states of undoped a-Si:H
Additional details
Publishing Information
- Journal Title
- Appl. Phys. Lett.
- Journal Volume
- 39
- Journal Issue
- 2
- Series
- Appl. Phys. Lett.
- Journal Page Range
- 152-154
- ISSN
- 0003-6951
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 12630347
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- AMORPHOUS STATE; CHARGE CARRIERS; COLLISIONS; DENSITY; DISTRIBUTION; DOPED MATERIALS; ENERGY LEVELS; EXPERIMENTAL DATA; HYDROGEN; INTERACTIONS; QUANTITY RATIO; SILICON; SPUTTERING; VARIATIONS
- Descriptors DEC
- DATA; ELEMENTS; INFORMATION; NONMETALS; NUMERICAL DATA; PHYSICAL PROPERTIES; SEMIMETALS