Published August 2009 | Version v1
Journal article

Evolution of domain walls and reversal mechanism in exchange-coupled nanolayers

  • 1. College of Physics and Electronic Engineering, Sichuan Normal University, Chengdu 610066 (China)
  • 2. School of Materials Science and Engineering, Nanyang Technological University, N4.1, 50 Nanyang Avenue, Singapore 639798 (Singapore)
  • 3. Department of Physics, National University of Singapore, Singapore 117542 (Singapore)

Description

The demagnetization process for an exchange-coupled double-nanolayer system with perpendicular easy axes has been investigated within a micromagnetic model. The nucleation field, coercivity and angular distribution of the magnetization, have been obtained as functions of the thickness L of the misaligned layer, the layer with the easy axis perpendicular to the applied field. It is found that the coercivity is identical to the nucleation field only for very small L. For larger L (larger than a quarter of its Bloch wall width), the nucleation field is negative while the coercivity saturates at 0.414HK, where HK is the anisotropy field. Thus for larger L, the coercivity mechanism is self-pinning rather than pure nucleation. This self-pinning has both attributes of traditional nucleation and pinning.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jmmm.2009.02.029

Additional details

Identifiers

DOI
10.1016/j.jmmm.2009.02.029;
PII
S0304-8853(09)00084-5;

Publishing Information

Journal Title
Journal of Magnetism and Magnetic Materials
Journal Volume
321
Journal Issue
15
Journal Page Range
p. 2322-2326
ISSN
0304-8853
CODEN
JMMMDC

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41009836
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
ANGULAR DISTRIBUTION; ANISOTROPY; BLOCH WALL; COERCIVE FORCE; DEMAGNETIZATION; EVOLUTION; HYSTERESIS; LAYERS; MAGNETIZATION; NANOSTRUCTURES; NUCLEATION
Descriptors DEC
DISTRIBUTION; DOMAIN STRUCTURE

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.