Evolution of domain walls and reversal mechanism in exchange-coupled nanolayers
Creators
- 1. College of Physics and Electronic Engineering, Sichuan Normal University, Chengdu 610066 (China)
- 2. School of Materials Science and Engineering, Nanyang Technological University, N4.1, 50 Nanyang Avenue, Singapore 639798 (Singapore)
- 3. Department of Physics, National University of Singapore, Singapore 117542 (Singapore)
Description
The demagnetization process for an exchange-coupled double-nanolayer system with perpendicular easy axes has been investigated within a micromagnetic model. The nucleation field, coercivity and angular distribution of the magnetization, have been obtained as functions of the thickness L of the misaligned layer, the layer with the easy axis perpendicular to the applied field. It is found that the coercivity is identical to the nucleation field only for very small L. For larger L (larger than a quarter of its Bloch wall width), the nucleation field is negative while the coercivity saturates at 0.414HK, where HK is the anisotropy field. Thus for larger L, the coercivity mechanism is self-pinning rather than pure nucleation. This self-pinning has both attributes of traditional nucleation and pinning.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jmmm.2009.02.029Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2009.02.029;
- PII
- S0304-8853(09)00084-5;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 321
- Journal Issue
- 15
- Journal Page Range
- p. 2322-2326
- ISSN
- 0304-8853
- CODEN
- JMMMDC
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41009836
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ANGULAR DISTRIBUTION; ANISOTROPY; BLOCH WALL; COERCIVE FORCE; DEMAGNETIZATION; EVOLUTION; HYSTERESIS; LAYERS; MAGNETIZATION; NANOSTRUCTURES; NUCLEATION
- Descriptors DEC
- DISTRIBUTION; DOMAIN STRUCTURE
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.