Effect of Sn Addition on Transformation Temperature and Thermal Properties for Cu-Al-Si Shape Memory Alloy
Creators
- 1. Department of Materials Engineering University of Technology, Baghdad (Iraq)
Description
Sn was added to Cu-14%Al-4.5%Ni shape memory alloy in three Percentages (0.5,1,3)%to study the effect of the addition on microstructure, Transformation temperature, thermal properties and activation energythermal properties. SEM-EDS, XRD tests were performed on the specimens; DSC Measurement was performed on the alloys. A computer model was built via MATLAB to calculate the thermal properties by means of graphical integration for the DSC data. Results showed an increase in the transformation temperature and Equilibrium temperature outside the domain, also an increase in hysterics and spread with the increase of Sn Percentage, also results shown an increase in thermal properties (enthalpy and entropy and free energy), results showed also a decrease in activation energy more than the base alloy the 3% Sn Addition gave the best results in both transformation temperature and activation energy. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1757-899X/454/1/012050Additional details
Identifiers
Publishing Information
- Journal Title
- IOP Conference Series. Materials Science and Engineering (Online)
- Journal Volume
- 454
- Journal Issue
- 1
- Journal Page Range
- [10 p.]
- ISSN
- 1757-899X
Conference
- Title
- International Conference on Materials Engineering and Science
- Dates
- 8 Aug 2018
- Place
- Istanbul (Turkey)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52101958
- Subject category
- S36: MATERIALS SCIENCE; S42: ENGINEERING;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACTIVATION ENERGY; ALLOYS; CALORIMETRY; COMPUTERIZED SIMULATION; ENTHALPY; ENTROPY; FREE ENERGY; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SHAPE MEMORY EFFECT; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ENERGY; MICROSCOPY; PHYSICAL PROPERTIES; SCATTERING; SIMULATION; THERMODYNAMIC PROPERTIES