Observation of mass analyzed threshold ionization using synchrotron radiation on a new-style time of flight mass spectrometer
Creators
- 1. National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui 230029 (China)
- 2. State Key Laboratory of Magnetic Resonance and Atomic and Molecular Physics, Wuhan Institute of Physics and Mathematics, Chinese Academy of Sciences, Wuhan, Huibei 430071 (China) and Graduate School of the Chinese Academy of Sciences, Beijing 100039 (China)
Description
We have developed an efficient and applicable apparatus that combines mass-analyzed threshold ionization (MATI) with continuous molecular-beam mass spectrometry using tunable vacuum ultraviolet synchrotron radiation at National Synchrotron Radiation Laboratory. The new design, in which the spoiling field and the pulsed ionization field are perpendicular to each other, can obtain efficiently the ionic spectra of molecule. The MATI spectra of Ar and N2 have been recorded in the energy region between 15.5 and 17.5 eV to illustrate the feasibility of this scheme. With its unique features, the important experiment considerations are potentially a powerful tool for study of information of ionization energies and ionic states of complex organic compounds
Additional details
Identifiers
- DOI
- 10.1063/1.2727462;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 78
- Journal Issue
- 4
- Journal Page Range
- p. 043104-043104.5
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38104686
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ARGON; COMPLEXES; IONIZATION; MASS SPECTROSCOPY; MOLECULAR BEAMS; NITROGEN; ORGANIC COMPOUNDS; SPECTRA; SYNCHROTRON RADIATION; TIME-OF-FLIGHT MASS SPECTROMETERS; ULTRAVIOLET RADIATION
- Descriptors DEC
- BEAMS; BREMSSTRAHLUNG; DYNAMIC MASS SPECTROMETERS; ELECTROMAGNETIC RADIATION; ELEMENTS; FLUIDS; GASES; MASS SPECTROMETERS; MEASURING INSTRUMENTS; NONMETALS; RADIATIONS; RARE GASES; SPECTROMETERS; SPECTROSCOPY; TIME-OF-FLIGHT SPECTROMETERS
Optional Information
- Notes
- (c) 2007 American Institute of Physics