Improved photovoltaic properties of a-Si/β-FeSi2/c-Si double heterojunction by Al-doping
Creators
- 1. School of Electronic and Information Engineering, South China University of Technology, Guangzhou 510640 (China)
Description
Al-doped β-FeSi2 thin film was sputtered on Si substrate and then applied to the amorphous-Si/β-FeSi2/crystalline-Si (a-Si/β-FeSi2/c-Si) double heterojunction. The X-ray diffraction result confirmed the formation of β-FeSi2 crystallization. The result of carrier lifetime measurement implied that Al-doping could improve the carrier lifetime and infrared response property of β-FeSi2 thin film. Such improvements were ascribed to the reduction of Si vacancy density by Al atom occupation. Based on the improved Al-doped β-FeSi2 thin film, the prepared a-Si/β-FeSi2/c-Si double heterojunction exhibited prominent enhancements in open-circuit voltage, short-circuit current density, fill factor, and energy conversion efficiency than that of the un-doped β-FeSi2 double heterojunction. These results reveal an attractive way to improve the photovoltaic property of a-Si/β-FeSi2/c-Si double heterojunction using Al-doped β-FeSi2 thin film.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physb.2011.12.018Additional details
Identifiers
- DOI
- 10.1016/j.physb.2011.12.018;
- PII
- S0921-4526(11)01211-7;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 407
- Journal Issue
- 4
- Journal Page Range
- p. 756-758
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43098169
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AMORPHOUS STATE; CARRIER LIFETIME; CRYSTALLIZATION; CRYSTALS; CURRENT DENSITY; DOPED MATERIALS; ENERGY CONVERSION; FILL FACTORS; HETEROJUNCTIONS; IRON SILICIDES; MAGNETRONS; PHOTOVOLTAIC EFFECT; SILICON; SPUTTERING; SUBSTRATES; THIN FILMS; VACANCIES; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CONVERSION; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIFFRACTION; DIMENSIONLESS NUMBERS; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; IRON COMPOUNDS; LIFETIME; MATERIALS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; PHASE TRANSFORMATIONS; PHOTOELECTRIC EFFECT; POINT DEFECTS; SCATTERING; SEMICONDUCTOR JUNCTIONS; SEMIMETALS; SILICIDES; SILICON COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.