Published October 2007 | Version v1
Journal article

Determination of the stress field in textured duplex steel using the TOF neutron diffraction method

  • 1. Faculty of Physics and Applied Computer Science, AGH-University of Science and Technology, Al. Mickiewicza 30, 30-059 Cracow (Poland)
  • 2. LIM, CNRS UMR 8006, Ecole Nationale Superieure, d'Arts et Metiers, 151 Bd de l'Hopital, 75013 Paris (France)
  • 3. ISIS, STFC Rutherford Appleton Laboratory, Chilton Didcot, Oxfordshire OX11 0QX (United Kingdom)

Description

A new method for determining the residual stresses in two-phase material is proposed. The method is based on the diffraction measurements analysed using a model of elasto-plastic deformation. The time-of-flight neutron diffraction technique was applied to determine lattice strains and a self-consistent rate-independent model was used to predict the second-order stresses in austeno-ferritic duplex steel. As the result of analysis, the stress state and elastic energy for each polycrystalline grain was found. Finally, the influence of different parameters characterizing elastoplastic deformation on the second-order stresses was studied

Availability note (English)

Available from http://dx.doi.org/10.1016/j.actamat.2007.07.044

Additional details

Identifiers

DOI
10.1016/j.actamat.2007.07.044;
PII
S1359-6454(07)00505-8;

Publishing Information

Journal Title
Acta Materialia
Journal Volume
55
Journal Issue
18
Journal Page Range
p. 6219-6233
ISSN
1359-6454
CODEN
ACMAFD

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39047803
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
DEFORMATION; FERRITIC STEELS; NEUTRON DIFFRACTION; PLASTICITY; POLYCRYSTALS; RESIDUAL STRESSES; STRAINS; TIME-OF-FLIGHT METHOD
Descriptors DEC
ALLOYS; CARBON ADDITIONS; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; IRON ALLOYS; IRON BASE ALLOYS; MECHANICAL PROPERTIES; SCATTERING; STEELS; STRESSES; TRANSITION ELEMENT ALLOYS

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.