Published July 1, 1983
| Version v1
Journal article
X-ray evidence for a terraced GaAs/AlAs superlattice
Creators
- 1. Department of Physics and Materials Research Laboratory, University of Illinois at Urbana--Champaign, Urbana, Illinois 61801
Description
We report an x-ray diffraction study of a GaAs/AlAs superlattice, showing satellite reflections which lie on a line making a constant, nonzero angle with the [00L] reciprocal lattice rod containing the fundamental reflections. The results indicate a terraced superlattice structure in which the chemical modulation of the GaAs/AlAs layers is tilted with respect to the (001) lattice planes. This tilt imposes a reduced lateral domain size on the superlattice, which can be deduced from the angular widths of the satellite reflections
Additional details
Publishing Information
- Journal Title
- Appl. Phys. Lett.
- Journal Volume
- 43
- Journal Issue
- 1
- Series
- Appl. Phys. Lett.
- Journal Page Range
- 59-61
- ISSN
- 0003-6951
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 14791751
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM ARSENIDES; CRYSTAL LATTICES; GALLIUM ARSENIDES; LAYERS; REFLECTION; SUPERLATTICES; VARIATIONS; X-RAY DIFFRACTION
- Descriptors DEC
- ALUMINIUM COMPOUNDS; ARSENIC COMPOUNDS; ARSENIDES; COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; GALLIUM COMPOUNDS; SCATTERING