On estimation of complex refractive index and colour of dry black and cyan offset inks by a multi-function spectrophotometer
- 1. Department of Physics and Mathematics, University of Joensuu, PO Box 111, FI-80101 Joensuu (Finland)
- 2. Measurement and Sensor Laboratory, University of Oulu, Technology Park 127, FI-87400 Kajaani (Finland)
- 3. VTT Technical Research Centre of Finland, PO Box 1199, FI-70211 Kuopio (Finland)
- 4. Laboratory of Paper Coating and Converting and Center for Functional Materials, Porthaninkatu 3, Åbo Akademi University, FI-20500 Turku (Finland)
Description
The optical properties of inks have much importance in quality inspection of prints. For instance, gloss and gloss mottling of a print depend not only on the surface roughness of the print but also on the spectral properties such as the wavelength-dependent complex refractive index of the ink. We have developed a device, the so-called multi-function spectrophotometer (MFS), that allows the measurement of reflectance and thereby assessment of the complex refractive index of the dry ink. Here, we report on the complex refractive index of dry black and cyan offset inks. Such information has importance in the study of gloss of prints. Furthermore, we show that the colour of these dry inks can be obtained with our apparatus by using light scattering data from the dry ink
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-0233/19/11/115601Additional details
Identifiers
- DOI
- 10.1088/0957-0233/19/11/115601;
- PII
- S0957-0233(08)78421-2;
Publishing Information
- Journal Title
- Measurement Science and Technology
- Journal Volume
- 19
- Journal Issue
- 11
- Journal Page Range
- [6 p.]
- ISSN
- 0957-0233
- CODEN
- MSTCEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44114935
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- COLOR; EQUIPMENT; INKS; INSPECTION; LIGHT SCATTERING; REFRACTIVE INDEX; ROUGHNESS; SPECTROPHOTOMETERS; SURFACES
- Descriptors DEC
- MEASURING INSTRUMENTS; OPTICAL PROPERTIES; ORGANOLEPTIC PROPERTIES; PHYSICAL PROPERTIES; SCATTERING; SURFACE PROPERTIES