Published August 11, 2000
| Version v1
Journal article
A comparison of the performance of irradiated p-in-n and n-in-n silicon microstrip detectors read out with fast binary electronics
Creators
- Allport, P.P.
- Andricek, L.
- Buttar, C.M.
- Carter, J.R.
- Costa, M.J.
- Drage, L.M.
- Dubbs, T.
- Goodrick, M.J.
- Greenall, A.
- Hill, J.C.
- Jones, T.
- Moorhead, G.
- Morgan, D.
- O'Shea, V.
- Phillips, P.W.
- Raine, C.
- Riedler, P.
- Robinson, D.
- Saavedra, A.
- Sadrozinski, H.F-W.
- Sanchez, J.
- Smith, N.A.
- Stapnes, S.
- Terada, S.
- Unno, Y.
Description
Both n-strip on n-bulk and p-strip on n-bulk silicon microstrip detectors have been irradiated at the CERN PS to a fluence of 3x1014 p cm-2 and their post-irradiation performance compared using fast binary readout electronics. Results are presented for test beam measurements of the efficiency and resolution as a function of bias voltage made at the CERN SPS, and for noise measurements giving detector strip quality. The detectors come from four different manufacturers and were made as prototypes for the SemiConductor Tracker of the ATLAS experiment at the CERN LHC
Additional details
Identifiers
- PII
- S016890020000259X;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 450
- Journal Issue
- 2-3
- Journal Page Range
- p. 297-306
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34041036
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CERN LHC; CERN PS SYNCHROTRON; ELECTRONIC EQUIPMENT; MATERIALS TESTING; PHYSICAL RADIATION EFFECTS; READOUT SYSTEMS; SI SEMICONDUCTOR DETECTORS; SILICON DIODES
- Descriptors DEC
- ACCELERATORS; CYCLIC ACCELERATORS; EQUIPMENT; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATION EFFECTS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; STORAGE RINGS; SYNCHROTRONS; TESTING
Optional Information
- Copyright
- Copyright (c) 2000 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.