Application of parallel processing for automatic inspection of printed circuits

Automated visual inspection of printed electronic circuits is a challenging application for image processing systems. Detailed inspection requires high speed analysis of gray scale imagery along with high quality optics, lighting, and sensing equipment. A prototype system has been developed and demonstrated at the Environmental Research Institute of Michigan (ERIM) for inspection of multilayer thick-film circuits. The central problem of real-time image processing is solved by a special-purpose parallel processor which includes a new high-speed Cytocomputer. In this chapter the inspection process and the algorithms used are summarized, along with the functional requirements of the machine vision system. Next, the parallel processor is described in detail and then performance on this application is given