Published 2005
| Version v1
Book
About line width of parametric back X radiation of relativistic electrons in thin crystals
Creators
- 1. Ints. Teoreticheskoj Fiziki im. A.I. Akhiezera, Natsional'nyj Nauchnyj Tsentr Khar'kovskij Fiziko-Tekhnicheskij Inst., Khar'kov (Ukraine)
- 2. Fiziko-Tekhnicheskij Fakul'tet, Khar'kovskij Natsional'nyj Univ., Khar'kov (Ukraine)
Description
no abstract available
Additional details
Additional titles
- Original title (Russian)
- О ширине линий параметрического рентгеновского излучения назад релятивистских электронов в тонких кристаллах
Publishing Information
- Publisher
- UNTs DO
- Imprint Place
- Moscow (Russian Federation)
- ISBN
- 5-88800-297-6
- Imprint Title
- Summaries of reports of XXXV International conference on physics of interaction of charged particles with crystals
- Imprint Pagination
- 200 p.
- Journal Page Range
- p. 94
Conference
- Title
- XXXV International conference on physics of interaction of charged particles with crystals
- Original Conference Title
- XXXV Mezhdunarodnaya konferentsiya po fizike vzaimodejstviya zaryazhennykh chastits s kristallami
- Dates
- 31 May - 2 Jun 2005
- Place
- Moscow (Russian Federation)
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 38082824
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract, Conference
- Descriptors DEI
- BREMSSTRAHLUNG; CRYSTALS; ELECTRON BEAMS; LINE WIDTHS; MEV RANGE 10-100; MULTIPLE SCATTERING; SILICON; X RADIATION
- Descriptors DEC
- BEAMS; ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY RANGE; IONIZING RADIATIONS; LEPTON BEAMS; MEV RANGE; PARTICLE BEAMS; RADIATIONS; SCATTERING; SEMIMETALS
Optional Information
- Notes
- 3 refs. Imprint:Tezisy dokladov XXXV Mezhdunarodnoj konferentsii po fizike vzaimodejstviya zaryazhennykh chastits s kristallami