Published March 15, 2013
| Version v1
Journal article
Theoretical calculation on electronic excitation and compression effect in tungsten
- 1. Institute of Atomic and Molecular Physics, Sichuan University, Chengdu 610065 (China)
- 2. College of Physical Science and Technology, Sichuan University, Chengdu 610065 (China)
Description
The vacancy formation enthalpy of tungsten under the condition of intense laser irradiation and compression has been investigated from first-principles, respectively. The results show that the monovacancy formation enthalpy of tungsten tends to increase as the electronic temperature is increased, which can explain the fact that the melting process becomes more difficult under high electronic temperature. In addition, the monovacancy formation enthalpy of tungsten is found to increase from 3.198 eV at 0 GPa to 4.184 eV at 100 GPa, which results in the retardation of diffusion under the condition of compression
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physb.2013.01.003Additional details
Identifiers
- DOI
- 10.1016/j.physb.2013.01.003;
- PII
- S0921-4526(13)00004-5;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 413
- Journal Page Range
- p. 69-72
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45051755
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COMPRESSION; DIFFUSION; EV RANGE; EXCITATION; FORMATION HEAT; LASER RADIATION; MELTING; PRESSURE RANGE GIGA PA; TUNGSTEN; VACANCIES
- Descriptors DEC
- CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY RANGE; ENERGY-LEVEL TRANSITIONS; ENTHALPY; METALS; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; POINT DEFECTS; PRESSURE RANGE; RADIATIONS; REACTION HEAT; REFRACTORY METALS; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.