Published October 21, 2009 | Version v1
Journal article

Effect of SSPM surface coating on light collection efficiency and optical crosstalk for scintillation detection

  • 1. University of Michigan, Ann Arbor, MI (United States)
  • 2. Radiation Monitoring Devices, Inc., Watertown, MA (United States)
  • 3. Lawrence Berkeley National Laboratory, Berkeley, CA (United States)

Description

As part of a project to develop a complete stochastic model of the solid state photomultiplier (SSPM), we simulated the effects of a reflective layer in the non-active region which reflects photons back into the crystal for a second chance at detection. The scintillation photon collection efficiency of the proposed device is greater than that predicted by the scintillation yield and the ratio of active area. The added reflectivity also increases external optical crosstalk from hot carrier emissions and the collection efficiency for these photons was simulated to be of the same order as the scintillation photon collection efficiency. As a function of excess bias, the rate of hot carrier emissions will rise more rapidly than the photon detection efficiency (PDE), setting a practical upper limit on the applied bias. Due to spectral mismatch between detection and avalanche emission, a blue-sensitive SSPM will be largely transparent to its own emissions. The spatial dependence of externally reflected hot carrier emissions was determined to be approximately uniform.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2009.05.187

Additional details

Identifiers

DOI
10.1016/j.nima.2009.05.187;
PII
S0168-9002(09)01131-0;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
610
Journal Issue
1
Journal Page Range
p. 393-396
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
5. international conference on new developments in photodetection
Acronym
NDIP08
Dates
15-20 Jun 2008
Place
Aix-les-Bains (France)

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.