Published September 2009
| Version v1
Journal article
Structural analysis of surface layers using x-ray scattering at small glancing angle of incidence
Creators
- 1. Kobe Univ., Center for Supports to Research and Education Activities, Kobe, Hyogo (Japan)
Description
no abstract available
Additional details
Publishing Information
- Journal Title
- Materia (Sendai)
- Journal Volume
- 48
- Journal Issue
- 9
- Journal Page Range
- p. 445-451
- ISSN
- 1340-2625
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 41076934
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- DEPTH; GRAIN SIZE; INCIDENCE ANGLE; IRON; IRON OXIDES; LAYERS; REFLECTION; RESIDUAL STRESSES; SILICON; SMALL ANGLE SCATTERING; SPATIAL DISTRIBUTION; SPATIAL RESOLUTION; STRAINS; SURFACE PROPERTIES; SYNCHROTRON RADIATION; THIN FILMS; TUNGSTEN; X-RAY DIFFRACTION
- Descriptors DEC
- BREMSSTRAHLUNG; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; DISTRIBUTION; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; IRON COMPOUNDS; METALS; MICROSTRUCTURE; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; REFRACTORY METALS; RESOLUTION; SCATTERING; SEMIMETALS; SIZE; STRESSES; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Notes
- 17 refs., 9 figs.