Published October 1, 2003
| Version v1
Journal article
Crystallization and phase separation in Ge2+xSb2Te5 thin films
Creators
- 1. STMicroelectronics, Central R and D, Via Olivetti 2, 20041 Agrate Brianza, MI (Italy)
- 2. CNR-IMM Sezione di Catania, Stradale Primosole 50, 95121 Catania (Italy)
- 3. Department of Physics and Astronomy, University of Catania, Via Santa Sofia 64, 95123 Catania (Italy)
Description
The electrical properties and the structure of isothermally annealed thin films of Ge2+xSb2Te5 (x=0 and 0.5) have been studied by in situ electrical measurements, x-ray diffraction, and transmission electron microscopy analyses. Phase separation has been observed in samples with an excess of Ge; by annealing amorphous Ge2.5Sb2Te5 films at temperatures in the range 130-160 deg. C, the material cannot be completely converted into the metastable face-centered-cubic (fcc) structure. At temperatures higher than 160 deg. C, the residual amorphous material may be converted into a fcc structure with a lower lattice parameter
Additional details
Identifiers
- DOI
- 10.1063/1.1604458;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 94
- Journal Issue
- 7
- Journal Page Range
- p. 4409-4413
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36005596
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; ANTIMONY TELLURIDES; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; FCC LATTICES; GERMANIUM COMPOUNDS; LATTICE PARAMETERS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- ANTIMONY COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CUBIC LATTICES; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; FILMS; HEAT TREATMENTS; MICROSCOPY; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; SCATTERING; TELLURIDES; TELLURIUM COMPOUNDS
Optional Information
- Notes
- (c) 2003 American Institute of Physics.