Published July 2002
| Version v1
Journal article
Hard X-ray microscopy activities at Spring-8
Creators
- 1. Spring-8, Mikazuki, Hyogo (Japan)
- 2. Kansai Medical University, Hirakata, Osaka (Japan)
- 3. AIST Tsukuba, Photonics Research Institute, Ibaraki (Japan)
- 4. AIST Kansai, Photonics Research Institute, Osaka (Japan)
Description
Development of micro-focusing optics for scanning microscopy and image forming optics for imaging microscopy are now in progress in Spring-8 by using varieties of optical devices: refractive lens, total reflection mirrors, Fresnel zone plates, and sputtered-sliced Fresnel zone plates. Spatial resolution of 100 nm has been achieved in scanning microscopy using highly coherent X-ray beam at a 248 m-long beamline 20XU and FZP focusing optics. Recent results on development of optical systems are described. (authors)
Additional details
Publishing Information
- Journal Title
- Journal de Physique. 4
- Journal Volume
- 104
- Journal Page Range
- p. 35-40
- ISSN
- 1155-4339
- CODEN
- JPICEI
Conference
- Title
- 7. international conference on X-Ray microscopy - X-Ray microscopy 2002
- Dates
- 28 Jul - 2 Aug 2002
- Place
- Grenoble (France)
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 34066023
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM OPTICS; HARD X RADIATION; OPTICAL MICROSCOPY; PERFORMANCE; SPRING-8 STORAGE RING
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MICROSCOPY; RADIATION SOURCES; RADIATIONS; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES; X RADIATION
Optional Information
- Notes
- 20 refs.