Published July 3, 2001
| Version v1
Journal article
Electron-optic system of the multicharge ion source (MIS-1)
- 1. Budker Institute of Nuclear Physics, Novosibirsk (Russian Federation)
- 2. State Research Enterprise 'Toriy', Moscow (Russian Federation)
- 3. Ryazan' State Radiotechnical Academy, Ryazan' (Russian Federation)
Description
Results obtained in designing of the electron-optic system (EOS) of the multicharge ion source (MIS-1) are reported. This system forms an extended (∼2 m) electron beam of power 1 MW. The length of the MIS-1 ion trap with an electron beam density greater than 2*103 A/cm2 is increased to 1.5 m. Recuperation of the electron beam energy is envisaged in the collector
Additional details
Identifiers
- DOI
- 10.1063/1.1390112;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 572
- Journal Issue
- 1
- Journal Page Range
- p. 170-177
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 8. international symposium on electron beam ion sources and traps and their applications
- Dates
- 5-8 Nov 2000
- Place
- Upton, NY (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35062261
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM OPTICS; ELECTRON BEAMS; ELECTRON DENSITY; FOCUSING; ION BEAMS; ION SOURCES; NUMERICAL ANALYSIS; TRAPS
- Descriptors DEC
- BEAMS; LEPTON BEAMS; MATHEMATICS; PARTICLE BEAMS
Optional Information
- Notes
- (c) 2001 American Institute of Physics.