Published April 30, 2012 | Version v1
Journal article

Orientation-dependent phase separation of GaAsSb epilayers grown by gas-source molecular-beam epitaxy

  • 1. Graduate Institute of Electronics Engineering, National Taiwan University, Taipei 10617, Taiwan (China)
  • 2. Department of Electrical Engineering and Graduate Institute of Photonics and Optoelectronics, National Taiwan University, Taipei 10617, Taiwan (China)

Description

This work describes a regular solution model that considers the free energy of the surface monolayer to explain the orientation-dependent phase separation in GaAsSb. In the proposed model, only the interaction between the second nearest-neighboring atoms sitting on the same monolayer contributes to the interaction parameter. Consequently, the parameter reduces to Ω/2 and Ω/3 for (111)B GaAsSb and (100) GaAsSb, where Ω denotes the parameter of bulk GaAsSb. By including the strain effect, the proposed model thoroughly elucidates the immiscibility behavior of (111)B GaAsSb and (100) GaAsSb. - Highlights: ► (111)B GaAsSb exhibits severe phase separation than (100) GaAsSb. ► We propose a model to calculate the monolayer free energy of different planes. ► Monolayer model suggests that (111)B GaAsSb has larger interaction parameter. ► Monolayer model including strain well explains the immiscibility of GaAsSb.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2012.02.024

Additional details

Identifiers

DOI
10.1016/j.tsf.2012.02.024;
PII
S0040-6090(12)00141-1;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
520
Journal Issue
13
Journal Page Range
p. 4486-4492
ISSN
0040-6090
CODEN
THSFAP

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43098553
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
FREE ENERGY; INTERACTIONS; MATERIALS; MOLECULAR BEAM EPITAXY; STRAINS; SURFACES
Descriptors DEC
CRYSTAL GROWTH METHODS; ENERGY; EPITAXY; PHYSICAL PROPERTIES; THERMODYNAMIC PROPERTIES

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.