Published 1978
| Version v1
Journal article
Specimen contamination in analytical electron microscopy: sources and solutions
Description
Sources of contamination and the mechanisms of its growth are discussed. The multitude of factors affecting contamination are illustrated. Working solutions, both proven and hypothetical are described. Irradiation, both in the prepumping and imaging stages, is one of the main factors involved. (C.F.)
Additional details
Publishing Information
- Journal Title
- Ultramicroscopy
- Journal Volume
- 3
- Journal Issue
- 4
- Series
- Ultramicroscopy.
- Journal Page Range
- 375-380
Conference
- Title
- 2. Workshop on analytical electron microscopy.
- Dates
- 25 - 28 Jul 1978.
- Place
- Ithaca, NY, USA.
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 10482893
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTRON MICROSCOPY; ELECTRONS; IMAGE PROCESSING; IRRADIATION; PHYSICAL RADIATION EFFECTS; POLLUTION
- Descriptors DEC
- ELEMENTARY PARTICLES; FERMIONS; LEPTONS; MICROSCOPY; RADIATION EFFECTS