Published October 11, 2015
| Version v1
Journal article
The influence of electron track lengths on the γ-ray response of compound semiconductor detectors
Creators
- 1. Department of Physics, University of Surrey, Guildford GU2 7XH (United Kingdom)
- 2. Department of Electrical and Computer Engineering, Kerman University of Technology, Kerman (Iran, Islamic Republic of)
Description
The charge-trapping effect in compound semiconductor γ-ray detectors in the presence of a uniform electric field is commonly described by Hecht's relation. However, Hecht's relation ignores the geometrical spread of charge carriers caused by the finite range of primary and secondary electrons (δ-rays) in the detector. In this paper, a method based on the Shockley–Ramo theorem is developed to calculate γ-ray induced charge pulses by taking into account the charge-trapping effect associated with the geometrical spread of charge carriers. The method is then used to calculate the response of a planar CdTe detector to energetic γ-rays by which the influence of electron track lengths on the γ-ray response of the detectors is clearly shown
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2015.07.006Additional details
Identifiers
- DOI
- 10.1016/j.nima.2015.07.006;
- PII
- S0168-9002(15)00828-1;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 797
- Journal Page Range
- p. 255-259
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47030736
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CDTE SEMICONDUCTOR DETECTORS; CHARGE CARRIERS; ELECTRIC FIELDS; ELECTRONS; GAMMA SPECTROSCOPY; LENGTH; PARTICLE TRACKS; PULSES; SEMICONDUCTOR MATERIALS
- Descriptors DEC
- DIMENSIONS; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; MATERIALS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.