Published October 11, 2015 | Version v1
Journal article

The influence of electron track lengths on the γ-ray response of compound semiconductor detectors

  • 1. Department of Physics, University of Surrey, Guildford GU2 7XH (United Kingdom)
  • 2. Department of Electrical and Computer Engineering, Kerman University of Technology, Kerman (Iran, Islamic Republic of)

Description

The charge-trapping effect in compound semiconductor γ-ray detectors in the presence of a uniform electric field is commonly described by Hecht's relation. However, Hecht's relation ignores the geometrical spread of charge carriers caused by the finite range of primary and secondary electrons (δ-rays) in the detector. In this paper, a method based on the Shockley–Ramo theorem is developed to calculate γ-ray induced charge pulses by taking into account the charge-trapping effect associated with the geometrical spread of charge carriers. The method is then used to calculate the response of a planar CdTe detector to energetic γ-rays by which the influence of electron track lengths on the γ-ray response of the detectors is clearly shown

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2015.07.006

Additional details

Identifiers

DOI
10.1016/j.nima.2015.07.006;
PII
S0168-9002(15)00828-1;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
797
Journal Page Range
p. 255-259
ISSN
0168-9002
CODEN
NIMAER

Optional Information

Copyright
Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.