Published October 1, 2006 | Version v1
Journal article

Mode-locking and dynamical correlation effects in a driven Josephson junction network

  • 1. Department of Technology, Faculty of Education, Shimane University, 1060 Nishikawatsu, Matsue 690-8504 (Japan)

Description

Mode-locking phenomena in a Josephson junction network (JJN) driven by both dc and ac currents are studied using a numerical simulation. We consider a ladder type of structure of the JJN, i.e., Josephson junction ladder (JJL). Under a random magnetic field, it is found that the mode locking exists in the present system, and mode-locked steps are observed in the dc current-voltage characteristics. Outside the steps, due to the effect of the random field, plastic deformation of phase-phase coupling occurs, and then there appears plastic flow. As the bias current is increased further, transition from the plastic to elastic flow state occurs. Around the transition point, a critical behavior of the voltage-voltage correlation is observed. We discuss the peculiar nature of the mode-locking phenomena in the JJL

Additional details

Identifiers

DOI
10.1016/j.physc.2006.04.005;
PII
S0921-4534(06)00276-0;

Publishing Information

Journal Title
Physica. C, Superconductivity
Journal Volume
445-448
Journal Page Range
p. 249-252
ISSN
0921-4534
CODEN
PHYCE6

Conference

Title
18. international symposium on superconductivity
Acronym
ISS 2005
Dates
24-25 Oct 2005
Place
Tsukuba (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38066638
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CORRELATIONS; COUPLING; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; JOSEPHSON JUNCTIONS; MAGNETIC FIELDS; MODE LOCKING; PLASTICITY; RANDOMNESS
Descriptors DEC
CURRENTS; ELECTRICAL PROPERTIES; MECHANICAL PROPERTIES; PHYSICAL PROPERTIES; SUPERCONDUCTING JUNCTIONS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.