Mode-locking and dynamical correlation effects in a driven Josephson junction network
Creators
- 1. Department of Technology, Faculty of Education, Shimane University, 1060 Nishikawatsu, Matsue 690-8504 (Japan)
Description
Mode-locking phenomena in a Josephson junction network (JJN) driven by both dc and ac currents are studied using a numerical simulation. We consider a ladder type of structure of the JJN, i.e., Josephson junction ladder (JJL). Under a random magnetic field, it is found that the mode locking exists in the present system, and mode-locked steps are observed in the dc current-voltage characteristics. Outside the steps, due to the effect of the random field, plastic deformation of phase-phase coupling occurs, and then there appears plastic flow. As the bias current is increased further, transition from the plastic to elastic flow state occurs. Around the transition point, a critical behavior of the voltage-voltage correlation is observed. We discuss the peculiar nature of the mode-locking phenomena in the JJL
Additional details
Identifiers
- DOI
- 10.1016/j.physc.2006.04.005;
- PII
- S0921-4534(06)00276-0;
Publishing Information
- Journal Title
- Physica. C, Superconductivity
- Journal Volume
- 445-448
- Journal Page Range
- p. 249-252
- ISSN
- 0921-4534
- CODEN
- PHYCE6
Conference
- Title
- 18. international symposium on superconductivity
- Acronym
- ISS 2005
- Dates
- 24-25 Oct 2005
- Place
- Tsukuba (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38066638
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CORRELATIONS; COUPLING; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; JOSEPHSON JUNCTIONS; MAGNETIC FIELDS; MODE LOCKING; PLASTICITY; RANDOMNESS
- Descriptors DEC
- CURRENTS; ELECTRICAL PROPERTIES; MECHANICAL PROPERTIES; PHYSICAL PROPERTIES; SUPERCONDUCTING JUNCTIONS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.